Description
ZEISS EVO is a family of versatile scanning electron microscopes (SEM) based on a modular platform designed for a wide range of research and industrial applications. The system combines reliable imaging performance, flexible configuration, and intuitive operation.
EVO is intended for users who need a dependable tool for everyday work — from routine quality control to applied research in materials science, industry, and natural sciences. With multiple vacuum modes, the system enables efficient imaging of conductive and non-conductive, hydrated, or contaminated samples with minimal preparation.
Key Features
- Reliable SEM imaging with nanometer-scale resolution
- Modular platform configurable for specific applications
- Efficient imaging of non-conductive samples
- Support for automated imaging and analysis workflows
- User-friendly interface for operators of different experience levels
Technologies
- Variable Pressure (VP): imaging non-conductive samples without coating
- Extended Pressure (ESEM): imaging hydrated and biological samples in near-natural conditions
- LaB6 electron source: increased beam brightness and improved contrast
- Beam Deceleration: enhanced surface sensitivity and reduced beam impact on the sample
- EDS/EBSD: elemental and crystallographic analysis
Applications
- Quality control and industrial inspection
- Materials and metallurgy analysis
- Semiconductor and electronics research
- Geology and raw materials analysis
- Life sciences and natural sciences research
Advantages
- Versatility: one platform for multiple applications and sample types
- Ease of use: suitable for both experienced users and beginners
- Flexibility: wide range of configurations and add-ons
- Real-world sample capability: minimal sample preparation required
