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Micro compression tester, MCT-W

Shimadzu (Japan)

Description

The Shimadzu MCT-W micro compression tester is a specialized system for evaluating the mechanical strength of individual microparticles, granules, microcomponents, and fine fibers. It applies precisely controlled compressive forces using electromagnetic loading and records specimen displacement to characterize fracture force, deformation, and loading behavior.

The series includes MCT-W200, MCT-W201, MCT-W500, and MCT-W501. Depending on the model, test forces reach 1961 or 4903 mN and displacement measurement ranges extend to 100 or 10 µm. An optical micrometer head supports particle dimension measurement and precise positioning under the diamond indenter. Software displays results and force–displacement curves.

Features

  • Electromagnetic low-force loading with an accuracy of ±1% of the indicated force or 0.1 mN, whichever is greater.
  • Compression to failure or a preset force, load–unload testing, and cyclic loading.
  • Optical observation and particle dimension measurement with standard ×10 and ×50 objectives.
  • Standard 50 µm diameter flat diamond indenter, with alternative indenters available as options.
  • Optional accessories for in-test observation, image recording, and elevated-temperature testing.

Applications

  • Compression testing of ceramic particles, metal powders, and polymer granules.
  • Characterization of microcapsules, pigments, and fine fibers.
  • Materials research, pharmaceutical studies, and quality control of particulate materials.

Technical Specifications

Models MCT-W500, MCT-W501, MCT-W200, MCT-W201
Loading method Electromagnetic
Test force range MCT-W500 / W501: 9.8–4903 mN; MCT-W200 / W201: 9.8–1961 mN
Test force accuracy ±1% of indicated force or 0.1 mN, whichever is greater
Displacement measurement method Differential transformer
Displacement measurement range 0–100 µm (W500, W200); 0–10 µm (W501, W201)
Minimum displacement increment 0.01 µm (W500, W200); 0.001 µm (W501, W201)
Displacement linearity Within ±2% of full scale
Optical magnification Approx. ×100 and ×500; ×200, ×400, ×1000 optional
Specimen size measurement Up to approx. 200 µm in 0.1 µm increments (×50 objective)
Indenter Flat diamond, Ø50 µm; Ø500 µm and triangular pyramidal indenters optional
Test modes Compression; load–unload; cyclic loading
Maximum number of cycles Up to 1000 (MCT-W specification)
Stage travel in X and Y 25 mm per axis, 0.01 mm increment (0.001 mm optional)
Elevated-temperature testing 50–250 °C, optional unit
Weight Tester unit: approx. 45 kg; control unit: approx. 13 kg

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