Description
The Shimadzu EDX-7200 energy dispersive X-ray fluorescence spectrometer is designed for highly accurate qualitative and quantitative elemental analysis of solid, liquid, and powdered samples without destroying them. The instrument detects elements ranging from sodium (Na) to uranium (U) and is used for material quality control, environmental testing, and product compliance screening.
The high-performance silicon drift detector (SDD) provides high sensitivity, resolution, and measurement speed. Electronic detector cooling eliminates the need for liquid nitrogen, while automatic switching of collimators and primary filters allows measurement conditions to be optimized for different sample types.
Features
- High analytical speed thanks to an advanced SDD detector and high-speed electronics.
- Automatic switching between four collimators with diameters of 1, 3, 5, and 10 mm to select the optimal irradiation area.
- Five automatically selectable primary filters to improve trace element detection sensitivity.
- Built-in sample observation camera for precise selection of the analysis area.
- Optional vacuum measurement or helium purge systems to improve sensitivity for light elements.
- Optional 12-position sample turret for automated sequential analysis.
