Description
Scanning Probe Microscope
The Shimadzu SPM-9700HT is a state-of-the-art scanning probe microscope that examines sample surfaces using an extremely sharp probe. The instrument enables detailed analysis of surface topography and local physical or mechanical properties of solids with nanometer-scale precision. Combining high resolution with versatile operating modes, the SPM-9700HT is an essential tool for research and industrial applications in materials science, nanotechnology, and biophysics.
Features
- Supports multiple scanning modes — contact, dynamic, phase, and lateral force (LFM) — for comprehensive sample analysis.
- High resolution: horizontal up to 0.2 nm, vertical up to 0.01 nm, allowing detection of the finest surface details.
- Various scanning ranges (from 2.5×2.5×0.3 µm to 125×125×7 µm) provide flexibility for samples of different sizes.
- Accommodates samples up to 24 mm in diameter and 8 mm in height.
- High stability and positioning accuracy ensure reproducible results even during long measurements.
