Description
X-ray Diffractometer
Shimadzu XRD-6100 is designed to handle a wide range of research and industrial applications, including qualitative and quantitative phase analysis, X-ray structural analysis, determination of residual austenite, crystallinity degree and crystallite size, thin film analysis, stress measurement and mapping. The instrument ensures high measurement accuracy, result stability, and complete operator safety thanks to its fully enclosed protective housing.
Features
- Performs all main types of X-ray studies — from standard phase analysis to residual stress and texture examinations.
- Compatible with all X-ray tubes conforming to European standards.
- Wide range of optional attachments and detectors for enhanced functionality.
- High-precision sample positioning system ensures measurement stability.
- Compact design and user-friendly interface for efficient laboratory and industrial operation.
