Description
Sequential wavelength-dispersive X-ray fluorescence spectrometer
The highly sensitive XRF-1800 instrument, featuring excellent sensitivity to light elements and good resolution of rare earth metal lines, is an ideal tool for analyzing heterogeneous materials of various origins.
Features
- The increased sensitivity of the new optical system is achieved through the use of a 4 kW X-ray tube with a thin window, a filter exchange system (5 types for primary radiation), the ability to adjust vacuum depth and gas flow rate (air, helium, nitrogen), as well as by reducing the distance from the tube to the sample and optimizing the diaphragm aperture.
- Element distribution mapping with a step of 250 µm enables qualitative and quantitative analysis of heterogeneous samples in the range from Be to U, while the ultra-fast scanning function (300 °/min) significantly reduces measurement time (2.5 min).
- First- and higher-order emissions are measured simultaneously.
- Determination of thickness and elemental composition of high-molecular films and inorganic coatings using the fundamental parameter method with Compton scattering lines.
- The unique and reliable sample feeding system minimizes downtime and ensures stable operation even under high-performance workloads.
