Description
Energy-dispersive X-ray fluorescence spectrometers
The EDX-7000 and EDX-8000/8100 spectrometers, with measurable element ranges from Na to U and from C to U respectively, utilize silicon drift detectors (SDD) to achieve high sensitivity and are successfully used in various fields of science and industry requiring precise and rapid measurements without sample destruction.
Features
- The high sensitivity of the instrument is achieved through the use of a high-performance SDD detector combined with optimized X-ray optics and primary filters.
- Thanks to the high count rate of the SDD detector, productivity has increased tenfold.
- The high resolution of the EDX-7000/8000/8100 spectrometers compared to previous models reduces peak overlap, improving the reliability of analytical results.
- Since a thermoelectric system is used to cool the SDD detector, liquid nitrogen is not required.
- The EDX-8000 spectrometer is equipped with an SDD detector with an ultra-thin window, enabling the detection of elements starting from carbon.
- These spectrometers can analyze all types of samples — from micro to macro objects — in both liquid and solid states.
